Re: [PATCH v8 00/12] iio: ssp_sensors: driver fixes, refactor and cleanup

[Jonathan Cameron]

On Fri, 15 May 2026 23:10:05 +0530
Sanjay Chitroda <sanjayembeddedse@xxxxxxxxx> wrote:

> From: Sanjay Chitroda <sanjayembeddedse@xxxxxxxxx>
> 
> Hi all,
> 
> This patch series improves resource cleanup and error handling in the
> SSP IIO SPI driver by adopting the recently introduced cleanup
> helpers.
> 
> The changes focus on making probe/remove paths more robust and easier
> to reason about by reducing manual unwind logic and ensuring that locks
> and dynamically allocated resources are released consistently across
> all exit paths.

Hi Sanjay,

Whilst I would encourage you to look at what sashiko came up with, IIRC
a lot of what it found is unrelated to the work in this series.
https://sashiko.dev/#/patchset/20260515174017.3962168-1-sanjayembedded%40gmail.com

My main concern here is that some of the changes are what I'd consider
non trivial so I think this needs some testing.  Are you doing that
or is this just compile tested?  Given we have a lot of new contributors
recently I'm not sure who is solving their own problems and who is looking
to help out with modernisation of old code and doesn't have hardware.

If you can't test, can any of the samsung folk help?
I have no idea if this device is present in modern chips or is just
there for legacy.

Jonathan